Eagertrailer Award

Several handling-systems and contacting-systems enable the test of components still located on wafers, also under temperature-pressurization.

Wafer-test

Wafer-test

Several handling-systems and contacting-systems enable the test of components still located on wafers, also under temperature-pressurization. As a result the defective components are thereby either marked or a wafer mapping in electronic form is compiled in order to enable a subsequent separation of failure parts.