HTV Institute for material analysis becomes accredited test laboratory!
24. November 2020
In May 2020, the HTV Institute for material analysis and the method “Layer Thickness Measurements on metals with the X-ray fluorescence method” were certified according to the international standards accredited by the DAkkS.
DIN EN ISO/IEC 17025
DIN EN ISO 3497:2001-12
As one of a few laboratories in Germany HTV provides results for layer thickness measurements with X-ray fluorescence analysis (XRF), which are internationally accepted and globally comparable.
Layer thickness measurements via XRF allow for instance a fast and non-destructive examination of soldering surfaces on PCBs, corrosion protection layers, chromate coatings, hard gold plating on connectors or layer thicknesses of a PCB finish.
